Synthesis and characterization in AuCu-Si nanostructures

T. E. Novelo; P. Amézaga-Madrid; R. D. Maldonado; A. I. Oliva; G. M. Alonzo-Medina

doi:10.1016/j.matchar.2015.01.010

Synthesis and characterization in AuCu-Si nanostructures

T. E. Novelo, P. Amézaga-Madrid, R. D. Maldonado, A. I. Oliva, G. M. Alonzo-Medina

Anahuac Mayab University

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Au/Cu bilayers with different Au:Cu concentrations (25:75, 50:50 and 75:25 at.%) were deposited on Si(100) substrates by thermal evaporation. The thicknesses of all Au/Cu bilayers were 150 nm. The alloys were prepared by thermal diffusion into a vacuum oven with argon atmosphere at 690 K during 1 h. X-ray diffraction analysis revealed different phases of AuCu and CuSi alloys in the samples after annealing process. CuSi alloys were mainly obtained for 25:75 at.% samples, meanwhile the AuCuII phase dominates for samples prepared with 50:50 at.%. Additionally, the Au:Cu alloys with 75:25 at.%, produce Au₂Cu₃ and Au₃Cu phases. The formed alloys were characterized by scanning electron microscopy (SEM), atomic force microscopy (AFM), transmission electron microscopy (TEM) and energy dispersive spectroscopy (EDS) to study the morphology and the elemental concentration of the formed alloys.

Original language	English
Pages (from-to)	83-89
Number of pages	7
Journal	Materials Characterization
Volume	101
DOIs	https://doi.org/10.1016/j.matchar.2015.01.010
State	Published - 1 Jan 2015

Keywords

AuCu alloy
CuSi alloy
Nanostructure alloy
Thermal diffusion

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@article{d38632aecab84cea8454b7555db3e7cf,

title = "Synthesis and characterization in AuCu-Si nanostructures",

abstract = "Au/Cu bilayers with different Au:Cu concentrations (25:75, 50:50 and 75:25 at.%) were deposited on Si(100) substrates by thermal evaporation. The thicknesses of all Au/Cu bilayers were 150 nm. The alloys were prepared by thermal diffusion into a vacuum oven with argon atmosphere at 690 K during 1 h. X-ray diffraction analysis revealed different phases of AuCu and CuSi alloys in the samples after annealing process. CuSi alloys were mainly obtained for 25:75 at.% samples, meanwhile the AuCuII phase dominates for samples prepared with 50:50 at.%. Additionally, the Au:Cu alloys with 75:25 at.%, produce Au2Cu3 and Au3Cu phases. The formed alloys were characterized by scanning electron microscopy (SEM), atomic force microscopy (AFM), transmission electron microscopy (TEM) and energy dispersive spectroscopy (EDS) to study the morphology and the elemental concentration of the formed alloys.",

keywords = "AuCu alloy, CuSi alloy, Nanostructure alloy, Thermal diffusion",

author = "Novelo, {T. E.} and P. Am{\'e}zaga-Madrid and Maldonado, {R. D.} and Oliva, {A. I.} and Alonzo-Medina, {G. M.}",

year = "2015",

month = jan,

day = "1",

doi = "10.1016/j.matchar.2015.01.010",

language = "Ingl{\'e}s",

volume = "101",

pages = "83--89",

journal = "Materials Characterization",

issn = "1044-5803",

publisher = "Elsevier Inc.",

}

TY - JOUR

T1 - Synthesis and characterization in AuCu-Si nanostructures

AU - Novelo, T. E.

AU - Amézaga-Madrid, P.

AU - Maldonado, R. D.

AU - Oliva, A. I.

AU - Alonzo-Medina, G. M.

PY - 2015/1/1

Y1 - 2015/1/1

N2 - Au/Cu bilayers with different Au:Cu concentrations (25:75, 50:50 and 75:25 at.%) were deposited on Si(100) substrates by thermal evaporation. The thicknesses of all Au/Cu bilayers were 150 nm. The alloys were prepared by thermal diffusion into a vacuum oven with argon atmosphere at 690 K during 1 h. X-ray diffraction analysis revealed different phases of AuCu and CuSi alloys in the samples after annealing process. CuSi alloys were mainly obtained for 25:75 at.% samples, meanwhile the AuCuII phase dominates for samples prepared with 50:50 at.%. Additionally, the Au:Cu alloys with 75:25 at.%, produce Au2Cu3 and Au3Cu phases. The formed alloys were characterized by scanning electron microscopy (SEM), atomic force microscopy (AFM), transmission electron microscopy (TEM) and energy dispersive spectroscopy (EDS) to study the morphology and the elemental concentration of the formed alloys.

AB - Au/Cu bilayers with different Au:Cu concentrations (25:75, 50:50 and 75:25 at.%) were deposited on Si(100) substrates by thermal evaporation. The thicknesses of all Au/Cu bilayers were 150 nm. The alloys were prepared by thermal diffusion into a vacuum oven with argon atmosphere at 690 K during 1 h. X-ray diffraction analysis revealed different phases of AuCu and CuSi alloys in the samples after annealing process. CuSi alloys were mainly obtained for 25:75 at.% samples, meanwhile the AuCuII phase dominates for samples prepared with 50:50 at.%. Additionally, the Au:Cu alloys with 75:25 at.%, produce Au2Cu3 and Au3Cu phases. The formed alloys were characterized by scanning electron microscopy (SEM), atomic force microscopy (AFM), transmission electron microscopy (TEM) and energy dispersive spectroscopy (EDS) to study the morphology and the elemental concentration of the formed alloys.

KW - AuCu alloy

KW - CuSi alloy

KW - Nanostructure alloy

KW - Thermal diffusion

UR - http://www.scopus.com/inward/record.url?scp=84921461947&partnerID=8YFLogxK

U2 - 10.1016/j.matchar.2015.01.010

DO - 10.1016/j.matchar.2015.01.010

M3 - Artículo

AN - SCOPUS:84921461947

SN - 1044-5803

VL - 101

SP - 83

EP - 89

JO - Materials Characterization

JF - Materials Characterization

ER -

Synthesis and characterization in AuCu-Si nanostructures

Abstract

Keywords

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