Crack's detection, measuring and counting for resistance's tests using images

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Resumen

Currently, material resistance research is looking for biomaterials where mechanical properties (like fatigure resistance) and biocompatibility are the main characteristics to take into account. To understand the behavior of materials subject to fatigue, usually we analyze how the material responds to cyclic forces. Failures due to fatigue are the first cause of cracks in materials. Normally, failures start with a superficial deficiency and produce micro cracks, which grow until a total break of the material. In this work we deal with the early detection of micro cracks on the surface of bone cement, while they are under fatigue tests, in order to characterize the material and design better and more resistant materials according to where they would be applied. The method presented for crack detection consists in several stages: noise reduction, shadow elimination, image segmentation and path detection for crack analysis. At the end of the analysis of one image, the number of cracks and the length of each one can be obtained (based on the maximum length of crack candidates). If a video is analyzed, the evolution of cracks in the material can be observed.

Idioma originalInglés
Título de la publicación alojadaProgress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 18th Iberoamerican Congress, CIARP 2013, Proceedings
Páginas142-149
Número de páginas8
EdiciónPART 2
DOI
EstadoPublicada - 1 dic 2013
Publicado de forma externa
Evento18th Iberoamerican Congress on Pattern Recognition, CIARP 2013 - Havana, Cuba
Duración: 20 nov 201323 nov 2013

Serie de la publicación

NombreLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
NúmeroPART 2
Volumen8259 LNCS
ISSN (versión impresa)0302-9743
ISSN (versión digital)1611-3349

Conferencia

Conferencia18th Iberoamerican Congress on Pattern Recognition, CIARP 2013
País/TerritorioCuba
CiudadHavana
Período20/11/1323/11/13

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