Study of the previous light-soaking effect on annealed hydrogenated polymorphous silicon solar cells structures

  • L. Hamui
  • , B. M. Monroy
  • , P. Roca I Cabarrocas
  • , G. Santana*
  • *Autor correspondiente de este trabajo

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

Resumen

This work describes a study performed on pm-Si:H PIN and NIP structures, deposited by PECVD. We show the effect of light-soaking (AM1.5) on pm-Si:H thin films structures optical properties. We propose a model for long range diffusion of hydrogen through the whole device. From the evolution of Raman spectra after annealing, we show that this long range motion of hydrogen causes a hydrogen rearrangement on the film along with a shift on the exodiffusion peaks explaining the degradation process in this type of devices. As a result we determined that for the PIN structure a hydrogen diffusion barrier is generated by defects, which causes a less degradation of its optoelectronic properties under illumination, and a more stable device during operation is expected.

Idioma originalInglés
Título de la publicación alojada2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
EditorialInstitute of Electrical and Electronics Engineers Inc.
Páginas737-741
Número de páginas5
ISBN (versión digital)9781479943982
DOI
EstadoPublicada - 15 oct 2014
Publicado de forma externa
Evento40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, Estados Unidos
Duración: 8 jun 201413 jun 2014

Serie de la publicación

Nombre2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Conferencia

Conferencia40th IEEE Photovoltaic Specialist Conference, PVSC 2014
País/TerritorioEstados Unidos
CiudadDenver
Período8/06/1413/06/14

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