Study of the previous light-soaking effect on annealed hydrogenated polymorphous silicon solar cells structures

  • L. Hamui
  • , B. M. Monroy
  • , P. Roca I Cabarrocas
  • , G. Santana*
  • *Autore corrispondente per questo lavoro

Risultato della ricercapeer review

Abstract

This work describes a study performed on pm-Si:H PIN and NIP structures, deposited by PECVD. We show the effect of light-soaking (AM1.5) on pm-Si:H thin films structures optical properties. We propose a model for long range diffusion of hydrogen through the whole device. From the evolution of Raman spectra after annealing, we show that this long range motion of hydrogen causes a hydrogen rearrangement on the film along with a shift on the exodiffusion peaks explaining the degradation process in this type of devices. As a result we determined that for the PIN structure a hydrogen diffusion barrier is generated by defects, which causes a less degradation of its optoelectronic properties under illumination, and a more stable device during operation is expected.

Lingua originaleEnglish
Titolo della pubblicazione ospite2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014
EditoreInstitute of Electrical and Electronics Engineers Inc.
Pagine737-741
Numero di pagine5
ISBN (elettronico)9781479943982
DOI
Stato di pubblicazionePublished - 15 ott 2014
Pubblicato esternamente
Evento40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver
Durata: 8 giu 201413 giu 2014

Serie di pubblicazioni

Nome2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Conference

Conference40th IEEE Photovoltaic Specialist Conference, PVSC 2014
Paese/TerritorioUnited States
CittàDenver
Periodo8/06/1413/06/14

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